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US Patent Issued to Photo electron Soul on Nov. 3 for "Electron gun, electron beam applicator, and irradiation position moving method" (Japanese Inventor)

ALEXANDRIA, Va., Nov. 3 -- United States Patent no. 12,785,029, issued on Nov. 3, was assigned to Photo electron Soul Inc. (Nagoya, Japan). "Electron gun, electron beam applicator, and irradiation po... Read More


US Patent Issued to Danmarks Tekniske Universitet on Nov. 3 for "Temperature control in liquid phase transmission electron microscopy" (Danish Inventors)

ALEXANDRIA, Va., Nov. 3 -- United States Patent no. 12,785,030, issued on Nov. 3, was assigned to Danmarks Tekniske Universitet (Kongens Lyngby, Denmark). "Temperature control in liquid phase transmi... Read More


US Patent Issued to Beijing University of Technology on Nov. 3 for "In-situ mechanical micro-electro-mechanical device and system, as well as double-tilt sample holder" (Chinese Inventors)

ALEXANDRIA, Va., Nov. 3 -- United States Patent no. 12,785,031, issued on Nov. 3, was assigned to Beijing University of Technology (Beijing). "In-situ mechanical micro-electro-mechanical device and s... Read More


US Patent Issued to Fractilia on Nov. 3 for "System and method for determining and/or predicting unbiased parameters associated with semiconductor measurements" (Texas Inventor)

ALEXANDRIA, Va., Nov. 3 -- United States Patent no. 12,785,032, issued on Nov. 3, was assigned to Fractilia LLC (Austin, Texas). "System and method for determining and/or predicting unbiased paramete... Read More


US Patent Issued to Hitachi High-Tech on Nov. 3 for "Charged particle beam device" (Japanese Inventors)

ALEXANDRIA, Va., Nov. 3 -- United States Patent no. 12,785,033, issued on Nov. 3, was assigned to Hitachi High-Tech Corp. (Tokyo). "Charged particle beam device" was invented by Hiroyuki Yamamoto (To... Read More


US Patent Issued to HITACHI HIGH-TECH on Nov. 3 for "Electron microscope" (Japanese Inventors)

ALEXANDRIA, Va., Nov. 3 -- United States Patent no. 12,785,034, issued on Nov. 3, was assigned to HITACHI HIGH-TECH Corp. (Tokyo). "Electron microscope" was invented by Katsura Takaguchi (Tokyo), Tak... Read More


US Patent Issued to ASML Netherlands on Nov. 3 for "Charged particle device, charged particle assessment apparatus, measuring method, and monitoring method" (Dutch Inventors)

ALEXANDRIA, Va., Nov. 3 -- United States Patent no. 12,785,035, issued on Nov. 3, was assigned to ASML Netherlands B.V. (Veldhoven, Netherlands). "Charged particle device, charged particle assessment... Read More


US Patent Issued to Applied Materials on Nov. 3 for "Ion source with wire form metal dopant" (Massachusetts Inventor)

ALEXANDRIA, Va., Nov. 3 -- United States Patent no. 12,785,036, issued on Nov. 3, was assigned to Applied Materials Inc. (Santa Clara, Calif.). "Ion source with wire form metal dopant" was invented b... Read More


US Patent Issued to Tokyo Electron on Nov. 3 for "Passivation equipment and passivation method for semiconductor device" (Taiwanese Inventors)

ALEXANDRIA, Va., Nov. 3 -- United States Patent no. 12,785,037, issued on Nov. 3, was assigned to Tokyo Electron Ltd. (Tokyo). "Passivation equipment and passivation method for semiconductor device" ... Read More


US Patent Issued to TRUMPF HUETTINGER SP. Z O. O. on Nov. 3 for "High power generator and method of supplying high power pulses" (Polish Inventors)

ALEXANDRIA, Va., Nov. 3 -- United States Patent no. 12,785,038, issued on Nov. 3, was assigned to TRUMPF HUETTINGER SP. Z O. O. (Zielonka, Poland). "High power generator and method of supplying high ... Read More